Electron Microscopes

Instead of light, electron microscopes use a focussed beam of electrons to generate a magnified image of a sample.

A Scanning Electron Microscope (SEM) rasters this focussed probe of electrons across the surface of the sample, and analyses the electrons and x-rays generated in the top surface interaction volume. Transmission Electron Microscopy (TEM) opens up higher resolution with electrons transmitted through ultrathin electron transparent samples.




Evo and Crossbeam images courtesy of Zeiss
7800F image courtesy of JEOL
Talos image courtesy of FEI/Thermo Scientific