Electron Microscopy

Electron Microscopes

Instead of light, electron microscopes use a focussed beam of electrons to generate a magnified image of a sample.

A Scanning Electron Microscope (SEM) rasters this focussed probe of electrons across the surface of the sample, and analyses the electrons and x-rays generated in the top surface interaction volume. Transmission Electron Microscopy (TEM) opens up higher resolution with electrons transmitted through ultrathin electron transparent samples.

^{Evo and Crossbeam images courtesy of Zeiss
7800F image courtesy of JEOL
Talos image courtesy of FEI/Thermo Scientific}