Advanced Imaging of Materials

Advanced Imaging of Materials (AIM)

AIM is an £9M EPSRC/Welsh Government funded integrated scientific imaging facility for Wales that can provide imaging and analytical capabilities across several length scales from Angstroms to centimetres.

The Centre will provide a fully-coupled micro/nano-analysis workflow via a state-of-the-art advanced correlative imaging (combining different data sets across length scales) with capability in transmission electron microscopy (TEM), scanning electron microscopy (SEM), Ion beam nanofabrication, X-ray Diffraction (XRD), X-ray Photoelectron Spectroscopy (XPS), Energy-Dispersive X-ray Spectroscopy (EDS), and micro and nano X-ray computed tomography (microCT). 

Want to use our advanced imaging facilities?

Fill in the AIM Analysis Request Form OLD and send it to aimaccess@swansea.ac.uk

X-Ray Microtomography