UHV LT Nanoprobe & NanoSAM

LTNanoprobeThe LT nanoprobe provides full Scanning Tunnelling Microscopy (STM) capabilities with four independent probes at cryogenic temperatures <5K. The UHV microscope is fitted with an in-situ SEM for precise navigation of the probe tips to the site of interest and local electrical measurements. Scanning Auger Microscopy (SAM) capability provides surface compositional analysis on a nanometre scale. Together the techniques can provide a complete electrical and compositional picture of wafer devices and nanostructures.

Application Areas

  • MEMS (Micro-Electro Mechanical Systems)
  • Semiconductors
  • Nanostructures
  • Functionalisation
  • Sensors
  • Electronics

Case Study

Semiconductor nanostructures

Four probe tips can be accurately positioned on to one-dimensional nanostructures such as nanotubes, nanowires and nanobelts to perform measurements of resistivity and electrical transport properties at low temperatures, whilst their exact surface composition can be determined with SAM.

Nanostructures are seen as the building blocks of future electronics and characterising the properties is vital to designing the correct function of nanodevices that includes lasers, bio-sensors and gas-sensors.