My current interests are centred primarily around the characterisation of devices and systems using scanning probe microscopes, and understanding the influence of those measurement techniques on the devices under study.  Through greater understanding of these detrimental interaction processes it will be possible to de-couple the measurement interactions and get a lot more information about device growth, operation, performance and failure.

With other members of staff in the multidisciplinary nanotechnology centre (MNC) we have developed a technique of powered-sample scanning tunnelling microscopy (STM), where samples are studied with STM whilst operating and emitting light.  This technique offers a unique ability to study defect evolution on the surface of real operating devices, and to characterise the operation of novel device structures.

Other research interests include understanding and improving the growth of self-templated polymer films, towards well-ordered self-assembled photonic bandgap materials, and optoelectronic coatings.

I currently hold a joint Royal Academy of Engineering / Engineering and Physical Sciences Research Council fellowship.

Selected Publications

Pre-prints are available.  Please email for details.

• R. J. Cobley, K. S. Teng, M. R. Brown, S. P. Wilks and P. Rees, "Direct real-time observation of catastrophic optical degradation in operating semiconductor lasers using scanning tunneling microscopy”, Appl. Phys. Lett. (accepted, in press).
• M. R. Brown, P. Rees, R. J. Cobley, K. S. Teng, S. P. Wilks and A. Hughes, "The Effect of Interface Roughness on Multi-Layer Hetero-Structures”,  J. Appl. Phys. (accepted, in press).
• R. J. Cobley, K. S. Teng, M. R. Brown and S. P. Wilks, "Cross-sectional scanning tunneling microscopy of biased semiconductor lasers", J. Appl. Phys. 102, 086714 (2007).
• M. R Brown, R. J. Cobley, K.S. Teng, P. Rees, S. P. Wilks, A. Sobiesierski, P. M. Smowton and P. Blood, "Modeling multiple quantum barrier effects and reduced electron leakage in red-emitting laser diodes”, J. Appl. Phys. 100, 084509 (2006).
• R. J. Cobley, K. S. Teng, T. G. G. Maffeïs and S. P. Wilks, "Cross-sectional scanning tunneling microscopy and spectroscopy of strain in buried heterostructure lasers”, Surf. Sci. 600, 2857-2859 (2006).
• K. S. Teng, R. J. Cobley, M. R. Brown, S. P. Wilks and P. R. Dunstan, "Investigation on (Al0.7Ga0.3)(0.5)In0.5P/(Al0.3Ga0.7)(0.5)In0.5P multi-quantum-barrier superlattice using cross-sectional scanning tunneling microscopy”, J. App. Phys. 98, 033525 (2005).
• R. J. Cobley, K. S. Teng, M. R. Brown, T. G. G. Maffeïs and S. P. Wilks, "Cross-sectional scanning tunneling microscopy of buried heterostructure lasers”, Int. J. Nanoscience 3, 525-531 (2004).

Links

• Royal Academy of Engineering
• EPSRC
• Multidisciplinary Nanotechnology Centre
• MNC Device Imaging Section